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  • Testers designed to simultaneously measure, analyze, and display high-speed variable digital signals in multiple signal (multichannel) systems by detecting logic threshold levels. These testers are typically stand-alone electronic units with multiple inputs that detect logic threshold levels and analyze the digital captured data following processor instructions and correlate them to a source code; the testers may convert the data in time graphics, computer programming languages (i.e., assembly languages), or other preprogrammed ways. Logic circuit testers are used typically to verify digital system operations; to simultaneously trace and correlate many digital signals; to detect and analyze transients; and to trace embedded software execution.
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