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  • Devices designed to form an even coating of carbon by means of a carbon evaporation procedure on the surface of non-conductive samples to be observed using an electron microscope. The procedure is based on the controlled evaporation of a high purity carbon rod in a dedicated sample coater that deposits a thin and even coat of carbon on the surface of non-metal samples, providing a uniform layer of carbon with a thickness (usually in the order of nanometers) according to the microscopic analysis to be performed. The samples are typically used for scanning and transmission electron microscopy examinations but may be used also for x-ray micro-analysis and other thin film applications.
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